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TBLDC32-2 DC Line Impedance Stabilisation Network

The TBLDC32-2 is a cutting-edge Line Impedance Stabilization Network designed for precise measurement of conducted emissions on DC lines within the frequency range of 9 kHz to 30 MHz. Compliant with the CISPR 16-1-2 and CISPR 11 standards, this device is a must-have for testing disturbance voltages at DC power ports of semiconductor power converters and similar equipment. With a maximum supply voltage of up to 1000V and a current capacity of 32A, the TBLDC32-2 ensures reliable and accurate measurements on both forward and return supply lines.

• Compliant with CISPR 16-1-2 and CISPR 11 standards
• Measures conducted emissions on DC lines

Key Features and Specifications

The TBLDC32-2 is equipped with a range of features that make it a versatile and powerful tool for DC line testing. Its robust stainless steel base and flanges for ground connection provide a stable platform for accurate measurements. The device features air core inductors, ensuring minimal signal loss and high performance. With a rotary switch on the front panel, users can easily measure common mode and differential mode emissions. Key specifications include a frequency range of 9 kHz to 30 MHz, a maximum continuous current of 25A, and a maximum current for 15 minutes of 32A.

• Air core inductors for high performance
• Rotary switch for common mode and differential mode emissions

Applications and Benefits

The TBLDC32-2 is an essential tool for engineers and technicians working with DC power systems. Its ability to measure conducted emissions and disturbance voltages on DC lines makes it ideal for ensuring compliance with international standards. The device's compact design and lightweight construction make it easy to transport and use in various testing environments. With its advanced features and specifications, the TBLDC32-2 provides peace of mind for users, ensuring reliable measurements and accurate results.

• Ensures compliance with international standards
• Easy to transport and use in various testing environments