In Stock Mf067200 - Semi Mf672 - Guide For Measuring Resistivity Profiles Perpendicular To The Surface Of A Silicon Wafer Using A Spreading Resistance Probe Gadget [9Vhx3Xzj]

SEMI MF672 - Guide for Resistivity Measurement

This SEMI MF672 guide is an essential tool for professionals in the semiconductor industry, providing comprehensive procedures for measuring resistivity profiles perpendicular to the surface of silicon wafers. With its precise and detailed instructions, this guide ensures accurate measurements across a wide range of resistivity ranges. Key features include: compatibility with polished, lapped, or ground surfaces, profiling through p-n junctions, and versatility for epitaxial films, substrates, diffused layers, and ion-implanted layers.

• Accurate measurement across various resistivity ranges
• Compatibility with different surface preparations
• Profiling through p-n junctions

Technical Specifications and Details

The guide is designed to meet the stringent requirements of semiconductor manufacturing, offering robust procedures for resistivity profiling. It emphasizes the importance of comparing the measured spreading resistance values with calibration standards of known resistivity, ensuring consistency and reliability. The guide also references a comprehensive list of SEMI standards, providing a solid foundation for users to follow best practices. Technical highlights include:

• Comparative measurement method with calibration standards
• Reference to SEMI standards for best practices
• Applicability to various types of silicon wafers

Applications and Benefits

SEMI MF672 is ideal for engineers and technicians in the semiconductor industry looking for a reliable and precise tool to measure resistivity profiles. The guide's comprehensive approach and emphasis on calibration standards make it an invaluable resource for profiling through p-n junctions and various wafer layers. By using this guide, professionals can enhance their productivity and accuracy in resistivity measurements. Target audiences include:

• Engineers and technicians in semiconductor manufacturing
• Quality assurance professionals
• Research and development teams

This guide is a must-have for anyone involved in the critical task of measuring resistivity profiles in silicon wafers, ensuring the highest quality and efficiency in semiconductor production.