Classic Psl Spheres, .15 μm, 150 Nm 15ml Bottle Polystyrene Latex Beads Essentials [d7AhYp9w]

PSL Spheres: Precision Calibration Solutions

The PSL Spheres, offered in a 15ml bottle, are the ideal choice for calibrating laser and liquid particle counters. These highly uniform polystyrene microspheres, with a diameter of .15 μm (150 nm), provide a precise and narrow peak standard deviation, ensuring accurate measurements. The spheres are calibrated within nanometers and referenced to NIST SRMN size standards for size traceability, guaranteeing reliable and consistent results.

• Uniformity: The spheres are highly uniform, ensuring consistent performance across various instruments.
• Traceability: Referenced to NIST standards, providing a reliable calibration source.

Technical Specifications and Properties

Each bottle contains spheres with a density of 1.05 g/cm³ and an index of refraction of 1.59 @ 589 nm, measured at 25 degrees centigrade. The particle size standards are available in the 100 nm to 100 microns range, ready for direct use without dilution. The spherical diameters are calibrated with traceability to NIST SRM size standards, ensuring the highest level of accuracy. The particle counter standards are packaged in deionized water solutions, providing a stable and safe medium for calibration.

• Density: 1.05 g/cm³, ensuring compatibility with various instruments.
• Index of Refraction: 1.59 @ 589 nm, providing accurate measurements.

Practical Applications and Benefits

Particle Counter Standards are essential for a wide range of applications, including the calibration of electron and atomic force microscopes, as well as KLA and Hitachi wafer inspection systems. They are also used to create aerosol size challenges for laser particle counters. In the semiconductor industry, size calibration is crucial, and these standards simplify the process, saving time and resources. Whether you are a researcher, engineer, or quality control professional, PSL Spheres offer the precision and reliability you need to ensure accurate measurements.

• Calibration of Microscopes: Essential for precise measurements in electron and atomic force microscopes.
• Wafer Inspection Systems: Used for calibrating KLA and Hitachi wafer inspection systems.