Everyday Jeol Bp101979-00 Olal Cont Pb Pcb Card Jws-2000 Wafer Review Sem Working Spare - Final Sale [lJqXZjnD]

JEOL BP101979-00 OLAL CONT PB PCB Card

Introducing the JEOL BP101979-00 OLAL CONT PB PCB Card, a high-quality component designed for precision engineering and technical applications. This PCB Card is a vital component of the JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System, renowned for its advanced imaging capabilities. With its Part No. BP101979-00 and Model No. OLAL CONT PB, this PCB Card is engineered to enhance the system's performance and reliability. Key features include: U12 connectivity, robust construction, and compatibility with the JEOL JWS-2000 SEM System. This product is a testament to JEOL's commitment to excellence in scientific and industrial equipment.

Product Specifications and Details

The JEOL BP101979-00 OLAL CONT PB PCB Card is a used working surplus, ensuring that you receive a cost-effective solution without compromising on quality. Despite its previous use, the card is in good physical condition, with signs of prior handling but no significant wear.

• Part No.: BP101979-00
• Model No.: OLAL CONT PB

This card is a direct replacement for the original component, offering seamless integration into your SEM system. The card is also backed by a 90-Day Satisfaction Guarantee, providing peace of mind and assurance of quality.

Applications and Benefits

The JEOL BP101979-00 OLAL CONT PB PCB Card is an essential component for researchers, engineers, and technicians working in semiconductor manufacturing, material science, and other precision engineering fields. Its use in the JEOL JWS-2000 SEM System allows for detailed wafer defect review and analysis, enhancing the efficiency and accuracy of your operations.

• Target Audience: Semiconductor manufacturers, material scientists, and engineers
• Practical Uses: Wafer defect review, material analysis, and research

By investing in this PCB Card, you are not only gaining a reliable component but also improving the overall performance and efficiency of your SEM system.