Overstock Deal Tel Tokyo Electron 3281-000095-13 Pcb Pst Opt Card 3208-000095-11 Used Working Best Choice [i1DZP2Se]

TEL Tokyo Electron PCB PST OPT Card - Premium Quality and Reliability

This TEL Tokyo Electron 3281-000095-13 PCB PST OPT Card is a high-quality, used working surplus component that offers exceptional reliability and performance. Designed for use with the TEL Tokyo Electron P-8 Fully Automatic Wafer Prober System, this card is a vital component for semiconductor testing and inspection. With its robust construction and advanced technology, it ensures precise and efficient operation, making it an ideal choice for professionals in the semiconductor industry.

Key Specifications and Features

Featuring the model number PCB PST OPT and part number 3208-000095-11, this card is equipped with the following specifications:

• Part Number: 3281-000095-13
• Model Number: PCB PST OPT
• Model Number: 3208-000095-11

This card has been removed from a TEL Tokyo Electron P-8 Fully Automatic Wafer Prober System, ensuring its compatibility and functionality. Its physical condition is good, although there are signs of previous use and handling, which is common for used surplus components.

Practical Applications and Benefits

Whether you are a professional in the semiconductor industry or a hobbyist looking to expand your capabilities, this TEL Tokyo Electron PCB PST OPT Card offers numerous practical applications and benefits. Its reliable performance and compatibility with the TEL Tokyo Electron P-8 Fully Automatic Wafer Prober System make it an essential component for semiconductor testing and inspection. By using this card, you can enjoy the following benefits:

• Enhanced Efficiency: This card ensures precise and efficient operation, helping you complete your tasks faster and more accurately.
• Reliability: With its robust construction and advanced technology, this card offers long-lasting performance and reliability.

Ideal for professionals and hobbyists alike, this TEL Tokyo Electron PCB PST OPT Card is a valuable addition to any semiconductor testing and inspection setup.