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Holiday Special Jeol Column Electron Detector Assembly Jws-2000 Wafer Defect Review Sem Working Tool [i52gwulM]
This JEOL Column Detector Assembly is working surplus. Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling.
Sale Details
- Item Condition: Working Surplus, 90 Day Warranty
- Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 20 lbs.
- Shipping Terms: All Domestic and International shipping quotes and/or fees are subject to change due to packaging requirements, custom packing, transport rate fluctuations, and supply chain demands. We will contact you regarding any shipments that require or incur additional after purchase packing fees or rate changes.
- Only items pictured are included: If a part is not pictured, or mentioned above, then it is not included in the sale. Pictured test equipment is not included or available for sale.
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For items with multiple quantities: The pictured item is not necessarily the one that will be sent. Serial numbers or country of manufacture may vary.
Lister 0 RL
