All-in-one C-map Max-n+ Chart En-y333: Eider To Aarhus Gadget [R8dcLrxo]

C-Map Max-N+ Chart Coverage: Eider to Aarhus

All-in-one C-map Max-n+ Chart En-y333: Eider To Aarhus Gadget [R8dcLrxo] is a comprehensive navigation solution designed for Lowrance, Simrad, and B&G chart plotters. This high-quality chart pack offers a vast array of advanced features, making it an essential tool for any boater, whether you are a saltwater angler, sailing enthusiast, or long-range cruiser. With extensive coverage areas, up-to-date data, and cutting-edge features, this chart pack ensures that no adventure is out of reach. The C-Map Max-N+ includes Dynamic Raster Charts, Tides & Currents, C-Marina Port Info, Custom Shaded Depths, High-Resolution Fishing charts, and 3D-View, enhancing every moment spent on the water.

Key Features and Benefits

Full Featured Vector Charts provide boaters with accurate, up-to-date vector chart detail, including Depth Areas and Contours, Spot Soundings, NavAids, Light Sectors, Wrecks/Obstructions, and Small Craft Facilities.

• Approach any harbor and inlet with confidence, thanks to detailed harbor and approach details.
• Stay informed and prepared with Tides and Currents, featuring Tide Level graphs and Current Flow graphs and colored arrows.

Enhanced Navigation and Experience

With the C-Marina Port Database and detailed marina charts, cruisers, fishermen, and sailors can access useful, categorized information for ports and marinas.

• Enjoy easy routing with the ability to automatically plot the shortest, safest route based on detailed chart data and vessel information.
• Ensure smooth docking with detailed Marina Port Plans, including slip spaces, restricted areas, and other valuable navigation information.

The Dynamic Raster feature offers a traditional “paper chart” look while allowing access to information on buoys, lights, and other details. High-resolution satellite imagery, High-Resolution Bathy Data, and Sport Fishing Data are also included, providing a complete and immersive navigation experience.