Hidden Gem Focused Ion Beam Scanning Electron Microscopy (fib Sample Preparation/fib + Sem/fib + Tem/fib + Spherical Aberration Correction) With Free Shipping [1MyJx2lg]

Focused Ion Beam Scanning Electron Microscopy

The Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) is a cutting-edge analytical tool designed for advanced material characterization. Utilizing a focused ion beam, this system offers unparalleled precision for material removal, deposition, implantation, cutting, and modification. Its versatility makes it ideal for a wide range of applications, including TEM sample preparation, micro/nano-structure processing, serial-section 3D reconstruction, and 3D atom probe sample preparation. The FIB-SEM is a must-have for researchers and engineers seeking high-quality, detailed analysis of materials and structures.

Product Specifications and Features

The FIB-SEM is equipped with state-of-the-art electrostatic lenses that enable the focusing of an ion beam into a tiny spot, allowing for targeted interactions with the material's surface. This precision is crucial for achieving accurate cross-sectional morphology and composition characterization. To ensure optimal performance, the system requires non-volatile, solid, and bulk samples with dimensions less than 20 mm in length and width, and a height of less than 5 mm. Additionally, samples must have good conductivity; otherwise, gold or carbon coating is recommended. The FIB-SEM guarantees the suitability of the cut sample thickness for transmission imaging, making it an ideal choice for transmission sample preparation. Key features include:

• High precision material modification and preparation
• Support for various materials, including metals, rocks, and lithium batteries
• Comprehensive analytical capabilities for 3D reconstruction and atom probe sample preparation

Applications and Benefits

The FIB-SEM is an indispensable tool for researchers and engineers in various fields. Its applications range from material science to electronics, and it offers numerous benefits for daily operations. By providing detailed insights into material structures and compositions, the FIB-SEM enables users to make informed decisions, optimize processes, and improve product quality. Target audiences include:

• Material scientists
• Electronics engineers
• Microscopy specialists

With its high-quality data, competitive pricing, and technical support from scientists, the FIB-SEM is the perfect choice for those seeking a reliable and efficient solution for their analytical needs. Don't miss out on the opportunity to enhance your research and development capabilities with this innovative tool.