Final Markdown Spherical Aberration Corrected Transmission Electron Microscope Analytical Service Instant 65% Discount [nqcbe7ZP]
Final Markdown Spherical Aberration Corrected Transmission Electron Microscope Analytical Service Instant 65% Discount [nqcbe7ZP] The Spherical Aberration Corrected Transmission Electron Microscope (SAC-TEM) Analytical Service offers unparalleled precision and detail in the characterization of na
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Final Markdown Spherical Aberration Corrected Transmission Electron Microscope Analytical Service Instant 65% Discount [nqcbe7ZP]
Final Markdown Spherical Aberration Corrected Transmission Electron Microscope Analytical Service Instant 65% Discount [nqcbe7ZP]
The Spherical Aberration Corrected Transmission Electron Microscope (SAC-TEM) Analytical Service offers unparalleled precision and detail in the characterization of nanomaterials. With its sub-angstrom resolution, this advanced technology is the go-to for obtaining detailed information on atomic arrangements, microstructure, and elemental distribution. The service includes a range of techniques such as High-Resolution Transmission Electron Microscopy (HRTEM), Single-Atom Imaging, High-Angle Annular Dark Field (HAADF), Electron Energy Loss Spectroscopy (EELS), and mapping, providing comprehensive insights into the materials under study.Comprehensive Material Analysis
This SAC-TEM Analytical Service is designed to cater to a wide array of material analysis needs. The Morphology Observation feature allows for two-dimensional microscopic morphology observation, including powder and nanoparticle morphology and particle size observation. Enhanced with 3D reconstruction, it enables three-dimensional visualization of the sample's structure. For Structural Analysis, the service utilizes selected area electron diffraction, high-resolution transmission images, and high-resolution scanning transmission images to delve into the material's internal structure. Composition Analysis is achieved through the integration of an energy dispersive spectrometer, which enables point, line, surface, and volume elemental distribution analysis, providing atomic resolution elemental mapping images.Sample Preparation and Highlights
To ensure the highest quality analysis, specific sample preparation is required. For bulk samples, a thickness of around 30 nm is recommended, prepared using focused ion beam (FIB) technology. Approximately 10 mg of powdered samples are needed. For nanoparticles or nanosheets, microgrids or ultra-thin carbon films are suggested for sample preparation. Magnetic elements in samples must be in powdered form to verify magnetism. This service stands out for its high-quality data, competitive pricing, and technical support provided by scientists. The Analytical Service Minimum order requirement is $250 per order, with a $200 handling fee applied for orders below $250. Contact [email protected] for more information and instructions on our Analytical Services program. Ensure that all sample requirements, SDS sheets, and additional information are confirmed prior to processing the order. ***Please do not ship any samples without authorization from MSE Supplies***.What Our Customers Say
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